Zeiss scanning electron microscope SEM

Technical Specifications：

Magnification: 5x –1000000x

Resolution: ~2.5–3 nm

Accelerating voltage: 0.2 – 30 kV

Detectors: Secondary / Backscattered electrons

Analysis: EDS elemental analysis

Vacuum: High / Low vacuum

Large sample compatibility

Software: SmartSEM

 • Scanning electron microscope for high-resolution surface analysis

 • Suitable for industrial QC and failure analysis

 • Supports multiple detectors SE / BSE

 • Expandable with EDS elemental analysis

 • Large chamber for industrial samples

 • Supports low vacuum and high vacuum modes

 • Easy operation for non-expert users

 • Auto focus and auto alignment

 • High stability electron beam system

 • SmartSEM software control

 • ZEISS EVO Used for microstructure analysis of industrial materials

 • Detects cracks, pores, contamination, surface defects

 • Supports elemental composition analysis

 • Widely used in automotive, electronic, and battery industries